- 相關推薦
XAFS applications in semiconductors
X-ray absorption fine structure (XAFS) has experienced a rapid development in the last three decades and has proven to be a powerful structural characterization technique nowadays. In this review, the XAFS basic principles including the theory, the data analysis, and the experiments have been introduced in detail. To show its strength as a local structure probe, the XAFS applications in semiconductors are summarized comprehensively, that is, thin films,quantum wells and dots, dilute magnetic semiconductors, and so on. In addition, certain new XAFS-related techniques,such as in-situ XAFS, micro-XAFS, and time-resolved XAFS are also shown.
作 者： WEI Shi-Qiang SUN Zhi-Hu PAN Zhi-Yun ZHANG Xin-Yi YAN Wen-Sheng ZHONG Wen-Jie 作者單位： WEI Shi-Qiang,SUN Zhi-Hu,PAN Zhi-Yun,YAN Wen-Sheng,ZHONG Wen-Jie(National Synchrotron Radiation Laboratory, University of Science and Technology of China, Hefei 230029, China)ZHANG Xin-Yi(Department of Physics, Surface Physics Laboratory (National Key Laboratory), and Synchrotron Radiation Research Center, Fudan University, Shanghai 200433, China)
刊 名： 核技術(shù)（英文版） SCI 英文刊名： NUCLEAR SCIENCE AND TECHNIQUES 年，卷(期)： 2006 17(6) 分類號： O57 關鍵詞： X-ray absorption fine structure (XAFS) Local structures Semiconductor quantum system Synchrotron radiation【XAFS applications in semiconductors】相關文章：
Existence and bifurcation of integral manifolds with applications04-28
Studies on RFQ accelerators and its applications04-28
Fiducial intervals of restricted parameters and their applications04-27
XAFS在凝聚態(tài)物質(zhì)研究中的應用04-27
遼河減壓渣油中非卟啉鎳的XAFS研究04-29
Chromate and selenate hydrocalumite solid solutions and their applications in waste treatment04-29
Multi-functional SiC/AI Composites for Aerospace Applications04-28
Attribute measure recognition approach and its applications to emitter recognition04-29
Elliptic Equation and Its Direct Applications to Nonlinear Wave Equations04-29